Part Number Hot Search : 
RT9227A 7C101 TDA72 CX24302 A1101 C1602 6008B HD74LV2G
Product Description
Full Text Search
 

To Download 1N750AD1A-JQRS Datasheet File

  If you can't view the Datasheet, Please click here to try to view without PDF Reader .  
 
 


  Datasheet File OCR Text:
  500mw zener diode semelab limited reserves the right to change test c onditions, parameter limits and package dimensions without notice. information furnished by semelab is believed to be both accurate and reliable at the time of going to press. however semelab assumes no responsibility for any errors or omissions discovered in its use. semelab encourage s customers to verify that datasheets are current before placing o rders. semelab limited semelab limited semelab limited semelab limited coventry road, lutterworth, leicestershire, le17 4 jb telephone +44 (0) 1455 556565 fax +44 (0) 1455 5526 12 email: sales@semelab-tt.com website: http://www.semelab-tt.com document number 8755 issue 2 page 1 of 3 1n750ad1a standard 5% zener voltage tolerance. hermetic ceramic surface mount package. space level and high-reliability screening options av ailable. absolute maximum ratings (t a = 25c unless otherwise stated) v f forward voltage i f = 200ma 1.5v i zm zener current 75ma p t total power dissipation at t sp = 25c 500mw derate above 25c tba t j junction temperature range -65 to +175c t stg storage temperature range -65 to +175c t sp maximum soldering pad temperature for 20s 300c thermal properties symbols parameters max. units r jsp(in) thermal resistance, junction to solder pads. t sp = 25c tba c/w
500mw zener diode 1n750ad1a semelab limited semelab limited semelab limited semelab limited coventry road, lutterworth, leicestershire, le17 4 jb telephone +44 (0) 1455 556565 fax +44 (0) 1455 5526 12 email: sales@semelab-tt.com website: http://www.semelab-tt.com document number 8755 issue 2 page 2 of 3 electrical characteristics (t a = 25c unless otherwise stated) symbols parameters test conditions min. typ max. units v z (1) zener voltage i z = 20ma 4.465 4.7 4.935 v z z (2) dynamic impedance i z = 20ma 19 w v r = 1.0v 2 i r reverse current v r = 1.0v t a = 150c 30 a a v z temp coefficient of v z -0.015 %/c notes notes notes notes (1) pulse condition: 20ms tp 50ms, 2% (2) zener impedance is derived by superimposing on i z a 60hz rms ac current equal to 10% of i z . mechanical data soldering temperature should be 260c for a maximum of 10 seconds. d lcc1 variant a (d 1a ) pad 1 anode pad 2 cathode dimension mm inches a 4.60 0.20 0.181 0.007 b 2.00 0.20 0.079 0.007 c 1.30 0.20 0.051 0.007 d 0.70 0.20 0.028 0.007 e 3.00 0.20 0.118 0.007 f 1.80 0.20 0.071 0.007 solder pad layout dimension mm inches a 5.08 0.2 b 1.40 0.059 c 2.03 0.08 2 1 sml dlcc1 a b c d d e f a b c
500mw zener diode 1n750ad1a semelab limited semelab limited semelab limited semelab limited coventry road, lutterworth, leicestershire, le17 4 jb telephone +44 (0) 1455 556565 fax +44 (0) 1455 5526 12 email: sales@semelab-tt.com website: http://www.semelab-tt.com document number 8755 issue 2 page 3 of 3 screening options space level (jqrs/esa) and high reliability options a re available in accordance with the high reliability and screening options handbook available for download from the from the tt electronics semelab web site. esa quality level products are based on the testing procedures specified in the generic escc 5000 and in the corresponding part detail specifications. semelabs qr216 and qr217 processing specifications (jqrs), in conjunction with the companies iso 9001: 2000 approval present a viable alternative to the america n mil- prf-19500 space level processing. qr217 (space level quality conformance) is based on the quality conformance inspection requirements of mil- prf- 19500 groups a (table v), b (table via), c (table vi i) and also esa / escc 5000 (chart f4) lot validation tests. qr216 (space level screening) is based on the scree ning requirements of mil-prf-19500 (table iv) and also e sa /escc 5000 (chart f3). jqrs parts are processed to the device data sheet a nd screened to qr216 with conformance testing to q217 groups a and b in accordance with mil-std-750 method s and procedures. additional conformance options are available, for ex ample pre-cap visual inspection, buy-off visit or data pac ks. these are chargeable and must be specified at the o rder stage (see ordering information). minimum order quantities may apply. alternative or additional customer specific conforma nce or screening requirements would be considered. contact semelab sales with enquires. marking details parts can be laser marked with approximately 7 char acters on two lines and always includes cathode identifica tion. typical marking would include part or specification number, week of seal or serial number subject to available space and legibility. customer specific marking requirements can be arrang ed at the time of order. example marking: ordering information part numbers are built up from type, package varian t, and screening level. the part numbers are extended to i nclude the additional options as shown below. type ? see electrical stability characteristics tab le package variant ? see mechanical data screening level ? see screening options (esa / jqrs) additional options: customer pre-cap visual inspection .cvp customer buy-off visit .cvb data pack .da solderability samples .ss scanning electron microscopy .sem radiography (x-ray) .xray total dose radiation test .rad mil-prf-19500 (qr217) group b charge .grpb group b destructive mechanical samples .gbdm (12 pi eces) group c charge .grpc group c destructive electrical samples .gcde (12 pi eces) group c destructive mechanical samples .gcdm (6 pie ces) esa/escc lot validation testing (subgroup 1) charge .lvt1 lvt1 destructive samples (environmental) .l1de (15 pieces) lvt1 destructive samples (mechanical) .l1dm (15 pie ces) lot validation testing (subgroup 2) charge .lvt2 lvt2 endurance samples (electrical) .l2d (15 pieces ) lot validation testing (subgroup 3) charge .lvt3 lvt3 destructive samples (mechanical) .l3d (5 piece s) additional option notes: 1) all ?additional options? are chargeable and must be specified at order stage. 2) when group b,c or lvt is required, additional el ectrical and mechanical destructive samples must be ordered 3) all destructive samples are marked the same as o ther production parts unless otherwise requested. example ordering information: the following example is for the 1n750a part with p ackage variant a, jqrs screening, additional group c confor mance testing and a data pack. part numbers: 1N750AD1A-JQRS (include quantity for flight parts) 1N750AD1A-JQRS.grpc (chargeable conformance option) 1N750AD1A-JQRS.gcde (charge for destructive parts) 1N750AD1A-JQRS.gcdm (charge for destructive parts) 1N750AD1A-JQRS.da (charge for data pack) customers with any specific requirements (e.g. marki ng or screening) may be supplied with a similar alternati ve part number (there is maximum 20 character limit to part numbers). contact semelab sales with enquiries high reliability and screening options handbook link : http://www.semelab.co.uk/pdf/misc/documents/hirel_ and_screening_options.pdf


▲Up To Search▲   

 
Price & Availability of 1N750AD1A-JQRS

All Rights Reserved © IC-ON-LINE 2003 - 2022  

[Add Bookmark] [Contact Us] [Link exchange] [Privacy policy]
Mirror Sites :  [www.datasheet.hk]   [www.maxim4u.com]  [www.ic-on-line.cn] [www.ic-on-line.com] [www.ic-on-line.net] [www.alldatasheet.com.cn] [www.gdcy.com]  [www.gdcy.net]


 . . . . .
  We use cookies to deliver the best possible web experience and assist with our advertising efforts. By continuing to use this site, you consent to the use of cookies. For more information on cookies, please take a look at our Privacy Policy. X